Abstract

Recent enhancements to vector network analyzers (VNA) enable a broader range of measurements. This presentation will review fundamental concepts of vector error correction and how these concepts are extended beyond two port measurements. Changes to the VNA architecture that facilitate a broader range of measurements will also be discussed.

Biography

David V. Blackham received the B.S.E.E. degree from Brigham Young University, Provo, UT, the M.S.E.M. degree from Stanford University, Stanford, CA, the M.S.E.E. degree from National Technological University, Fort Collins, CO, and a Ph.D. from the University of Leeds, Leeds, UK.  He started working for Hewlett-Packard in 1979 and now works for Agilent Technologies.  His work has included microwave sources, RF and microwave vector network analyzers, scalar detectors and bridges and microwave characterization of materials.  His current work focuses on error correction and measurement accuracy in vector network analyzers.  David is a member of the IEEE where he has reviewed technical papers for IEEE MTT-S publications over the past several years. David is serving on the IMS technical program committee.  David is also a member of ARFTG where he has presented papers, taught a measurement short course, and cochaired technical sessions.  He was recently elected to the ARFTG Executive Committee. 

Resources

David’s slides from the presentation and images from the event are provided below.